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Modeling Electronic Response Properties with an Explicit-Electron Machine Learning Potential
dc.contributor.author | Cools-Ceuppens, Maarten | |
dc.contributor.author | Dambre, Joni | |
dc.contributor.author | Verstraelen, Toon | |
dc.date.accessioned | 2022-06-26T02:27:56Z | |
dc.date.available | 2022-06-26T02:27:56Z | |
dc.date.issued | 2022-MAR 8 | |
dc.identifier.issn | 1549-9618 | |
dc.identifier.other | WOS:000812118400001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40027 | |
dc.source | WOS | |
dc.title | Modeling Electronic Response Properties with an Explicit-Electron Machine Learning Potential | |
dc.type | Journal article | |
dc.contributor.imecauthor | Dambre, Joni | |
dc.identifier.doi | 10.1021/acs.jctc.1c00978 | |
dc.source.numberofpages | 20 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1672 | |
dc.source.endpage | 1691 | |
dc.source.journal | JOURNAL OF CHEMICAL THEORY AND COMPUTATION | |
dc.identifier.pmid | MEDLINE:35171606 | |
dc.source.issue | 3 | |
dc.source.volume | 18 | |
imec.availability | Under review |
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