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Demonstration of a Free-layer Developed With Atomistic Simulations Enabling BEOL Compatible VCMA-MRAM with a Coefficient >= 100fJ/Vm

dc.contributor.authorCarpenter, Robert
dc.contributor.authorKim, Woojin
dc.contributor.authorSankaran, Kiroubanand
dc.contributor.authorAo, Nan
dc.contributor.authorBen Chroud, Mohamed
dc.contributor.authorKumar, A.
dc.contributor.authorTrovato, Anna
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorCouet, Sebastien
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2022-08-25T13:53:34Z
dc.date.available2022-07-09T02:27:43Z
dc.date.available2022-08-25T13:53:34Z
dc.date.issued2021
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000812325400082
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40083.2
dc.sourceWOS
dc.titleDemonstration of a Free-layer Developed With Atomistic Simulations Enabling BEOL Compatible VCMA-MRAM with a Coefficient >= 100fJ/Vm
dc.typeProceedings paper
dc.contributor.imecauthorCarpenter, Robert
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorSankaran, Kiroubanand
dc.contributor.imecauthorAo, Nan
dc.contributor.imecauthorBen Chroud, Mohamed
dc.contributor.imecauthorTrovato, Anna
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecCarpenter, Robert::0000-0003-0101-5952
dc.contributor.orcidimecKim, Woojin::0000-0002-2755-6661
dc.contributor.orcidimecSankaran, Kiroubanand::0000-0001-6988-7269
dc.contributor.orcidimecBen Chroud, Mohamed::0000-0003-3312-7342
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.identifier.doi10.1109/IEDM19574.2021.9720579
dc.identifier.eisbn978-1-6654-2572-8
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 11-16, 2021
dc.source.conferencelocationSan Francisco
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/40083.2*2022-08-25T13:48:42Zvalidation by library/open access desk
120.500.12860/400832022-07-09T02:27:43Z

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