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ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs

dc.contributor.authorKer, M-D
dc.contributor.authorWu, Wei-Min
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorSibaja-Hernandez, Arturo
dc.contributor.authorYadav, Sachin
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorYu, Hao
dc.contributor.authorAlian, AliReza
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorParvais, Bertrand
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2022-07-11T09:00:16Z
dc.date.available2022-07-09T02:28:02Z
dc.date.available2022-07-11T09:00:16Z
dc.date.issued2021
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000812325400084
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40095.2
dc.sourceWOS
dc.titleESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs
dc.typeProceedings paper
dc.contributor.imecauthorWu, Wei-Min
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorSibaja-Hernandez, Arturo
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecYadav, Sachin::0000-0003-4530-2603
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecAlian, AliReza::0000-0003-3463-416X
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.identifier.doi10.1109/IEDM19574.2021.9720581
dc.identifier.eisbn978-1-6654-2572-8
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 11-16, 2021
dc.source.conferencelocationSan Francisco
dc.source.journalna
imec.availabilityPublished - imec


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VersionItemDateSummary
320.500.12860/40095.32022-08-19T09:45:21Zvalidation by library/open access desk
220.500.12860/40095.2*2022-07-11T08:51:16Zvalidation by library/open access desk
120.500.12860/400952022-07-09T02:28:02Z

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