dc.contributor.author | Wu, Lizhou | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Taouil, Mottaqiallah | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Hamdioui, Said | |
dc.date.accessioned | 2022-08-18T14:05:30Z | |
dc.date.available | 2022-07-18T02:27:52Z | |
dc.date.available | 2022-07-19T09:19:41Z | |
dc.date.available | 2022-08-18T14:05:30Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1558-1101 | |
dc.identifier.other | WOS:000805289900322 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40136.3 | |
dc.source | WOS | |
dc.title | Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.23919/DATE51398.2021.9473999 | |
dc.identifier.eisbn | 978-3-9819263-5-4 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Electrical & electronic engineering | |
dc.source.beginpage | 1717 | |
dc.source.endpage | 1722 | |
dc.source.conference | Design, Automation and Test in Europe Conference and Exhibition (DATE) | |
dc.source.conferencedate | FEB 01-05, 2021 | |
dc.source.conferencelocation | Grenoble | |
dc.source.journal | na | |
imec.availability | Published - imec | |