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dc.contributor.authorWalke, Amey M.
dc.contributor.authorPopovici, Mihaela I.
dc.contributor.authorBanerjee, Kaustuv
dc.contributor.authorClima, Sergiu
dc.contributor.authorKumbhare, Pankaj
dc.contributor.authorDesmet, Johan
dc.contributor.authorMeersschaut, Johan
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2022-09-12T07:25:15Z
dc.date.available2022-07-25T02:28:23Z
dc.date.available2022-09-12T07:25:15Z
dc.date.issued2022-07-12
dc.identifier.issn0018-9383
dc.identifier.otherWOS:000826073500001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40172.2
dc.sourceWOS
dc.titleElectrical Investigation of Wake-Up in High Endurance Fatigue-Free La and Y Doped HZO Meal-Ferroelectric-Metal Capacitors
dc.typeJournal article
dc.typeJournal article (pre-print)
dc.contributor.imecauthorWalke, Amey M.
dc.contributor.imecauthorPopovici, Mihaela I.
dc.contributor.imecauthorBanerjee, Kaustuv
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorKumbhare, Pankaj
dc.contributor.imecauthorDesmet, Johan
dc.contributor.imecauthorMeersschaut, Johan
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecBanerjee, Kaustuv::0000-0001-8003-6211
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.identifier.doi10.1109/TED.2022.3186869
dc.source.numberofpages6
dc.source.peerreviewyes
dc.subject.disciplineElectrical & electronic engineering
dc.source.beginpage4744
dc.source.endpage4749
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.issue8
dc.source.volume69
imec.availabilityUnder review


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