dc.contributor.author | Wu, Wei-Min | |
dc.contributor.author | Ker, Ming-Dou | |
dc.contributor.author | Chen, Shih-Hung | |
dc.contributor.author | Sibaja-Hernandez, Arturo | |
dc.contributor.author | Yadav, Sachin | |
dc.contributor.author | Peralagu, Uthayasankaran | |
dc.contributor.author | Yu, Hao | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Putcha, Vamsi | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2022-08-31T09:31:50Z | |
dc.date.available | 2022-08-03T13:47:22Z | |
dc.date.available | 2022-08-31T09:31:50Z | |
dc.date.issued | 2022-01-25 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000748264000001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40201.2 | |
dc.source | WOS | |
dc.title | ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Wu, Wei-Min | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.contributor.imecauthor | Sibaja-Hernandez, Arturo | |
dc.contributor.imecauthor | Yadav, Sachin | |
dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
dc.contributor.imecauthor | Yu, Hao | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Putcha, Vamsi | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Wu, Wei-Min::0000-0002-8390-6785 | |
dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Yadav, Sachin::0000-0003-4530-2603 | |
dc.contributor.orcidimec | Yu, Hao::0000-0002-1976-0259 | |
dc.contributor.orcidimec | Alian, AliReza::0000-0003-3463-416X | |
dc.contributor.orcidimec | Putcha, Vamsi::0000-0003-1907-5486 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Chen, Shih-Hung::0000-0002-6481-2951 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/TED.2022.3141038 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Electrical & electronic engineering | |
dc.source.beginpage | 2180 | |
dc.source.endpage | 2187 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 4 | |
dc.source.volume | 69 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | This work was supported in part by the Ministry of Science and Technology (MOST), Taiwan, under Contract MOST 110-2622-8-009-017-TP1. | |