| dc.contributor.author | Monta, Kazuki | |
| dc.contributor.author | Katselas, Leonidas | |
| dc.contributor.author | Fodor, Ferenc | |
| dc.contributor.author | Miki, Takuji | |
| dc.contributor.author | Hatzopoulos, Alkis | |
| dc.contributor.author | Nagata, Makoto | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.date.accessioned | 2022-12-01T15:32:59Z | |
| dc.date.available | 2022-09-16T02:50:10Z | |
| dc.date.available | 2022-12-01T15:32:59Z | |
| dc.date.issued | 2022 | |
| dc.identifier.issn | 2168-2356 | |
| dc.identifier.other | WOS:000850868500014 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40435.2 | |
| dc.source | WOS | |
| dc.title | Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements | |
| dc.type | Journal article | |
| dc.contributor.imecauthor | Fodor, Ferenc | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.embargo | 2022-10-31 | |
| dc.identifier.doi | 10.1109/MDAT.2022.3178050 | |
| dc.source.numberofpages | 9 | |
| dc.source.peerreview | yes | |
| dc.source.beginpage | 79 | |
| dc.source.endpage | 87 | |
| dc.source.journal | IEEE DESIGN & TEST | |
| dc.source.issue | 5 | |
| dc.source.volume | 39 | |
| imec.availability | Published - open access | |
| dc.description.wosFundingText | This work was supported by JSPS KAKENHI under Grant JP22H04999. | |
