dc.contributor.author | Bufler, Fabian | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Favia, Paola | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Matagne, Philippe | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Hellings, Geert | |
dc.date.accessioned | 2022-11-15T10:53:45Z | |
dc.date.available | 2022-10-03T02:50:20Z | |
dc.date.available | 2022-11-15T10:53:45Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000857322600001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40530.2 | |
dc.source | WOS | |
dc.title | Monte Carlo Analysis of p-Type Si0.75Ge0.25-Channel Nanosheet Performance | |
dc.type | Journal article | |
dc.contributor.imecauthor | Bufler, Fabian | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Favia, Paola | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Matagne, Philippe | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.orcidimec | Bufler, Fabian::0000-0002-1558-9378 | |
dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.date.embargo | 2022-09-19 | |
dc.identifier.doi | 10.1109/TED.2022.3204934 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 6384 | |
dc.source.endpage | 6387 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 11 | |
dc.source.volume | 69 | |
imec.availability | Published - open access | |