Design of a C-testable booth multiplier using a realistic fault model
dc.contributor.author | Van Sas, Josephus | |
dc.contributor.author | Nowé, C. | |
dc.contributor.author | Pollet, D. | |
dc.contributor.author | Catthoor, Francky | |
dc.contributor.author | Vanoostende, Paul | |
dc.contributor.author | De Man, Hugo | |
dc.date.accessioned | 2021-09-29T12:50:17Z | |
dc.date.available | 2021-09-29T12:50:17Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/405 | |
dc.source | IIOimport | |
dc.title | Design of a C-testable booth multiplier using a realistic fault model | |
dc.type | Journal article | |
dc.contributor.imecauthor | Catthoor, Francky | |
dc.contributor.imecauthor | De Man, Hugo | |
dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 29 | |
dc.source.endpage | 41 | |
dc.source.journal | Journal of Electronic Testing: Theory and Applications | |
dc.source.issue | 1 | |
dc.source.volume | 5 | |
imec.availability | Published - open access |