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Design of a C-testable booth multiplier using a realistic fault model

dc.contributor.authorVan Sas, Josephus
dc.contributor.authorNowé, C.
dc.contributor.authorPollet, D.
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVanoostende, Paul
dc.contributor.authorDe Man, Hugo
dc.date.accessioned2021-09-29T12:50:17Z
dc.date.available2021-09-29T12:50:17Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/405
dc.sourceIIOimport
dc.titleDesign of a C-testable booth multiplier using a realistic fault model
dc.typeJournal article
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage29
dc.source.endpage41
dc.source.journalJournal of Electronic Testing: Theory and Applications
dc.source.issue1
dc.source.volume5
imec.availabilityPublished - open access


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