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dc.contributor.authorBabcock, J. A.
dc.contributor.authorFrancis, P.
dc.contributor.authorBashir, R.
dc.contributor.authorKabir, A. E.
dc.contributor.authorSchroder, D. K.
dc.contributor.authorLee, M.S.L.
dc.contributor.authorDhayagude, T.
dc.contributor.authorYindeepol, W.
dc.contributor.authorPrasad, S. J.
dc.contributor.authorKalnitsky, A.
dc.contributor.authorThomas, M. E.
dc.contributor.authorHaggag, H.
dc.contributor.authorEgan, K.
dc.contributor.authorBergemont, A.
dc.contributor.authorJansen, Philippe
dc.date.accessioned2021-10-14T12:39:57Z
dc.date.available2021-10-14T12:39:57Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4078
dc.sourceIIOimport
dc.titlePrecision electrical trimming of very low TCR poly-SiGe resistors
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage283
dc.source.endpage285
dc.source.journalIEEE Electron Device Letters
dc.source.issue6
dc.source.volume21
imec.availabilityPublished - open access


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