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Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study
dc.contributor.author | Cuduvally, Ramya | |
dc.contributor.author | Morris, Richard J. H. | |
dc.contributor.author | Oosterbos, Giel | |
dc.contributor.author | Ferrari, Piero | |
dc.contributor.author | Fleischmann, Claudia | |
dc.contributor.author | Forbes, Richard G. | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2022-12-06T03:08:17Z | |
dc.date.available | 2022-12-06T03:08:17Z | |
dc.date.issued | 2022-AUG 21 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.other | WOS:000886523000021 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40831 | |
dc.source | WOS | |
dc.title | Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study | |
dc.type | Journal article | |
dc.contributor.imecauthor | Cuduvally, Ramya | |
dc.contributor.imecauthor | Morris, Richard J. H. | |
dc.contributor.imecauthor | Fleischmann, Claudia | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Fleischmann, Claudia::0000-0003-1531-6916 | |
dc.identifier.doi | 10.1063/5.0106692 | |
dc.source.numberofpages | 13 | |
dc.source.peerreview | yes | |
dc.source.journal | JOURNAL OF APPLIED PHYSICS | |
dc.source.issue | 7 | |
dc.source.volume | 132 | |
imec.availability | Under review |
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