dc.contributor.author | Xing, Yufei | |
dc.contributor.author | Dong, Jiaxing | |
dc.contributor.author | Khan, Muhammad Umar | |
dc.contributor.author | Bogaerts, Wim | |
dc.date.accessioned | 2023-05-24T06:56:03Z | |
dc.date.available | 2022-12-10T03:09:31Z | |
dc.date.available | 2023-05-24T06:56:03Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 2330-4022 | |
dc.identifier.other | WOS:000889730400001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40855.2 | |
dc.source | WOS | |
dc.title | Capturing the Effects of Spatial Process Variations in Silicon Photonic Circuits | |
dc.type | Journal article | |
dc.contributor.imecauthor | Xing, Yufei | |
dc.contributor.imecauthor | Dong, Jiaxing | |
dc.contributor.imecauthor | Khan, Muhammad Umar | |
dc.contributor.imecauthor | Bogaerts, Wim | |
dc.contributor.orcidimec | Khan, Muhammad Umar::0000-0001-5760-7485 | |
dc.contributor.orcidimec | Bogaerts, Wim::0000-0003-1112-8950 | |
dc.date.embargo | 2022-11-22 | |
dc.identifier.doi | 10.1021/acsphotonics.2c01194 | |
dc.source.numberofpages | 17 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 928 | |
dc.source.endpage | 944 | |
dc.source.journal | ACS PHOTONICS | |
dc.source.issue | 4 | |
dc.source.volume | 10 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | Funding This work was supported by the Flemish Research Foundation (FWO-Vlaanderen) through Grant No. G013815N, and by the Flemish Agency for Innovation (VLAIO) and Luceda Photonics through the MEPIC project. | |