Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
dc.contributor.author | Cretu, Bogdan | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Simoen, Eddy | |
dc.date.accessioned | 2023-05-16T09:38:45Z | |
dc.date.available | 2023-01-01T03:09:37Z | |
dc.date.available | 2023-05-16T09:38:45Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000899998800001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40929.2 | |
dc.source | WOS | |
dc.title | Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.orcidext | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/TED.2022.3225248 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 254 | |
dc.source.endpage | 260 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 1 | |
dc.source.volume | 70 | |
imec.availability | Published - imec |