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Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
dc.contributor.author | Cretu, Bogdan | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Simoen, Eddy | |
dc.date.accessioned | 2023-01-01T03:09:37Z | |
dc.date.available | 2023-01-01T03:09:37Z | |
dc.date.issued | 2022-DEC 12 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000899998800001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40929 | |
dc.source | WOS | |
dc.title | Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs | |
dc.type | Journal article | |
dc.type | Journal article (pre-print) | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.identifier.doi | 10.1109/TED.2022.3225248 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
imec.availability | Under review |
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