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Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization
dc.contributor.author | Spampinato, Valentina | |
dc.contributor.author | Shi, Yuanyuan | |
dc.contributor.author | Serron, Jill | |
dc.contributor.author | Minj, Albert | |
dc.contributor.author | Groven, Benjamin | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | van der Heide, Paul | |
dc.contributor.author | Franquet, Alexis | |
dc.date.accessioned | 2023-01-15T03:15:19Z | |
dc.date.available | 2023-01-15T03:15:19Z | |
dc.date.issued | 2023-JAN 3 | |
dc.identifier.issn | 2196-7350 | |
dc.identifier.other | WOS:000906524500001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40983 | |
dc.source | WOS | |
dc.title | Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization | |
dc.type | Journal article | |
dc.type | Journal article (pre-print) | |
dc.contributor.imecauthor | Spampinato, Valentina | |
dc.contributor.imecauthor | Serron, Jill | |
dc.contributor.imecauthor | Minj, Albert | |
dc.contributor.imecauthor | Groven, Benjamin | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | van der Heide, Paul | |
dc.contributor.imecauthor | Franquet, Alexis | |
dc.contributor.orcidimec | Spampinato, Valentina::0000-0003-3225-6740 | |
dc.contributor.orcidimec | Serron, Jill::0000-0002-9101-8139 | |
dc.contributor.orcidimec | Minj, Albert::0000-0003-0878-3276 | |
dc.contributor.orcidimec | Groven, Benjamin::0000-0002-5781-7594 | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.contributor.orcidimec | van der Heide, Paul::0000-0001-6292-0329 | |
dc.contributor.orcidimec | Franquet, Alexis::0000-0002-7371-8852 | |
dc.identifier.doi | 10.1002/admi.202202016 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.journal | ADVANCED MATERIALS INTERFACES | |
imec.availability | Under review |
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