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BENEFITS OF MULTI-EXPOSURE FOR HYPERSPECTRAL IMAGING

dc.contributor.authorBlanch, Carolina
dc.contributor.authorGeelen, Bert
dc.contributor.authorVunckx, Kathleen
dc.contributor.authorMasschelein, Bart
dc.contributor.authorThijs, Steven
dc.date.accessioned2023-02-06T12:36:27Z
dc.date.available2023-01-28T03:22:36Z
dc.date.available2023-02-01T08:48:21Z
dc.date.available2023-02-06T12:36:27Z
dc.date.issued2022
dc.identifier.issn2158-6268
dc.identifier.otherWOS:000895925300033
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41034.3
dc.sourceWOS
dc.titleBENEFITS OF MULTI-EXPOSURE FOR HYPERSPECTRAL IMAGING
dc.typeProceedings paper
dc.contributor.imecauthorBlanch, Carolina
dc.contributor.imecauthorGeelen, Bert
dc.contributor.imecauthorVunckx, Kathleen
dc.contributor.imecauthorMasschelein, Bart
dc.contributor.imecauthorThijs, Steven
dc.contributor.orcidimecGeelen, Bert::0000-0002-9928-9064
dc.contributor.orcidimecVunckx, Kathleen::0000-0002-6962-1118
dc.contributor.orcidimecMasschelein, Bart::0000-0002-5636-1185
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.date.embargo9999-12-31
dc.identifier.doi10.1109/WHISPERS56178.2022.9955077
dc.identifier.eisbn978-1-6654-7069-8
dc.source.numberofpages5
dc.source.peerreviewyes
dc.subject.disciplineComputer science/information technology
dc.subject.disciplineElectrical & electronic engineering
dc.subject.disciplineEngineering
dc.source.conference12th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS)
dc.source.conferencedateSEP 13-16, 2022
dc.source.conferencelocationRome
dc.source.journal12th Workshop on Hyperspectral Imaging and Signal Processing: Evolution in Remote Sensing (WHISPERS)
imec.availabilityPublished - imec


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320.500.12860/41034.3*2023-02-06T12:35:04Zvalidation by library/open access desk
220.500.12860/41034.22023-01-31T12:13:27Zvalidation by imec author
120.500.12860/410342023-01-28T03:22:36Z

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