dc.contributor.author | Asanovski, Ruben | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Palestri, Pierpaolo | |
dc.contributor.author | Beckers, Arnout | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Selmi, Luca | |
dc.date.accessioned | 2023-07-24T11:10:07Z | |
dc.date.available | 2023-02-10T03:19:29Z | |
dc.date.available | 2023-07-24T11:10:07Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:000915823900001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41084.2 | |
dc.source | WOS | |
dc.title | Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures | |
dc.type | Journal article | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Beckers, Arnout | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Beckers, Arnout::0000-0003-3663-0824 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.date.embargo | 2023-04-30 | |
dc.identifier.doi | 10.1109/TED.2022.3233551 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2135 | |
dc.source.endpage | 2141 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 4 | |
dc.source.volume | 70 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | This work was supported in part by imec'sIndustrial Affiliation Program on Quantum Computing and Cryoelec-tronics and in part by the "Universita degli Studi di Modena e ReggioEmilia" through the "Bando giovani ricercatori 2021." The review of thisarticle was arranged by Editor G. Meneghesso | |