Publication:

Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures

Date

2023
Journal article
https://doi.org/10.1109/ted.2022.3233551
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Published version 2.45 MB

Author(s)

Asanovski, Ruben
;
Grill, Alexander  
;
Franco, Jacopo  
;
Palestri, Pierpaolo
;
Beckers, Arnout  
;
Kaczer, Ben  
;
Selmi, Luca

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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185 since deposited on 2023-02-10
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1237 since deposited on 2023-02-10
4last month
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Acq. date: 2026-07-21

Citations