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Articles
Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures
Publication:
Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures
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Date
2023
Journal article
https://doi.org/10.1109/TED.2022.3233551
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2.45 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Asanovski, Ruben
;
Grill, Alexander
;
Franco, Jacopo
;
Palestri, Pierpaolo
;
Beckers, Arnout
;
Kaczer, Ben
;
Selmi, Luca
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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129
since deposited on 2023-02-10
7
last month
4
last week
Acq. date: 2025-12-12
Views
1224
since deposited on 2023-02-10
2
last month
Acq. date: 2025-12-12
Citations