Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures

Asanovski, Ruben; Grill, Alexander; Franco, Jacopo; Palestri, Pierpaolo; Beckers, Arnout; Kaczer, Ben; Selmi, Luca

doi:10.1109/TED.2022.3233551

Publication:

Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures

Date

2023

Journal article

https://doi.org/10.1109/TED.2022.3233551

Simple item page Full metadata Statistics

Files

Published version 2.45 MB

Author(s)

;

;

;

;

;

;

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Statistics

159 since deposited on 2023-02-10

11last month

1last week

Acq. date: 2026-04-02

1228 since deposited on 2023-02-10

2last month

1last week

Acq. date: 2026-04-03

Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Downloads

Views

Citations

Statistics

Downloads

Views

Citations