Publication:

Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures

Date

2023
Journal article
https://doi.org/10.1109/ted.2022.3233551
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 2.45 MB

Author(s)

Asanovski, Ruben
;
Grill, Alexander  
;
Franco, Jacopo  
;
Palestri, Pierpaolo
;
Beckers, Arnout  
;
Kaczer, Ben  
;
Selmi, Luca

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Abstract

Description

Statistics

Downloads

228 since deposited on 2023-02-10
20last month
3last week
Acq. date: 2026-09-13

Views

1240 since deposited on 2023-02-10
Acq. date: 2026-09-13

Citations

Statistics

Downloads

228 since deposited on 2023-02-10
20last month
3last week
Acq. date: 2026-09-13

Views

1240 since deposited on 2023-02-10
Acq. date: 2026-09-13

Citations