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dc.contributor.authorBekaert, Joost
dc.contributor.authorVan Bael, Marleen
dc.contributor.authorTemst, K.
dc.contributor.authorVan Look, L.
dc.contributor.authorMoshchalkov, V. V.
dc.contributor.authorBruynseraede, Y.
dc.contributor.authorHowells, G. D.
dc.contributor.authorGrigorenko, A. N.
dc.contributor.authorBending, S. J.
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-10-14T12:40:41Z
dc.date.available2021-10-14T12:40:41Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4110
dc.sourceIIOimport
dc.titleScanning Hall probe microscopy observation of flux pinning in a Pb film covering an array of Co dots
dc.typeJournal article
dc.contributor.imecauthorBekaert, Joost
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.orcidimecBekaert, Joost::0000-0003-3075-3479
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage444
dc.source.endpage447
dc.source.journalSurface and Interface Analysis
dc.source.issue1
dc.source.volume30
imec.availabilityPublished - open access


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