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Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics

dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorTruijen, Brecht
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorGrill, Alexander
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorKaczer, Ben
dc.contributor.authorAlam, Md Nur Kutubul
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2023-06-01T15:20:45Z
dc.date.available2023-02-27T03:27:54Z
dc.date.available2023-06-01T15:20:45Z
dc.date.issued2022
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000922926400154
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41153.2
dc.sourceWOS
dc.titleModelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics
dc.typeProceedings paper
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorTruijen, Brecht
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorAlam, Md Nur Kutubul
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecTruijen, Brecht::0000-0002-2288-1414
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecAlam, Md Nur Kutubul::0000-0002-4608-3556
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.identifier.doi10.1109/IRPS48227.2022.9764588
dc.identifier.eisbn978-1-6654-7950-9
dc.source.numberofpages8
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/41153.2*2023-06-01T15:17:49Zvalidation by library/open access desk
120.500.12860/411532023-02-27T03:27:54Z

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