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MTJ degradation in SOT-MRAM by self-heating-induced diffusion

dc.contributor.authorVan Beek, Simon
dc.contributor.authorCai, Kaiming
dc.contributor.authorRao, Siddharth
dc.contributor.authorJayakumar, Ganesh
dc.contributor.authorCouet, Sebastien
dc.contributor.authorJossart, Nico
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2023-06-08T09:06:20Z
dc.date.available2023-02-27T03:27:55Z
dc.date.available2023-06-08T09:06:20Z
dc.date.issued2022
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000922926400041
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41155.2
dc.sourceWOS
dc.titleMTJ degradation in SOT-MRAM by self-heating-induced diffusion
dc.typeProceedings paper
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorCai, Kaiming
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorJayakumar, Ganesh
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorJossart, Nico
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecCai, Kaiming::0000-0002-1160-864X
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.identifier.doi10.1109/IRPS48227.2022.9764459
dc.identifier.eisbn978-1-6654-7950-9
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 27-31, 2022
dc.source.conferencelocationDallas
dc.source.journalna
imec.availabilityPublished - imec
dc.description.wosFundingTextThis work is supported by imec's industrial Affiliation program on STT-MRAM devices. The authors would also like to acknowledge the support of imec's fab, line and hardware teams.


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220.500.12860/41155.2*2023-06-08T09:05:07Zvalidation by library/open access desk
120.500.12860/411552023-02-27T03:27:55Z

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