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Artificial pinning arrays investigated by scanning Hall probe microscopy

dc.contributor.authorBending, S. J.
dc.contributor.authorHowells, G. D.
dc.contributor.authorGrigorenko, A. N.
dc.contributor.authorVan Bael, Marleen
dc.contributor.authorBekaert, Joost
dc.contributor.authorTemst, K.
dc.contributor.authorVan Look, L.
dc.contributor.authorMoshchalkov, V. V.
dc.contributor.authorBruynseraede, Y.
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorHumphreys, R. G.
dc.date.accessioned2021-10-14T12:40:49Z
dc.date.available2021-10-14T12:40:49Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4115
dc.sourceIIOimport
dc.titleArtificial pinning arrays investigated by scanning Hall probe microscopy
dc.typeJournal article
dc.contributor.imecauthorBekaert, Joost
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.orcidimecBekaert, Joost::0000-0003-3075-3479
dc.source.peerreviewno
dc.source.beginpage20
dc.source.endpage26
dc.source.journalPhysica C
dc.source.issue1_4
dc.source.volume332
imec.availabilityPublished - imec


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