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Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications
dc.contributor.author | Diaz-Fortuny, J. | |
dc.contributor.author | Saraza-Canflanca, P. | |
dc.contributor.author | Vandemaele, M. | |
dc.contributor.author | Bury, E. | |
dc.contributor.author | Degraeve, R. | |
dc.contributor.author | Kaczer, B. | |
dc.date.accessioned | 2023-02-27T03:28:07Z | |
dc.date.available | 2023-02-27T03:28:07Z | |
dc.date.issued | 2022 | |
dc.identifier.other | WOS:000925270200022 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41166 | |
dc.source | WOS | |
dc.title | Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Diaz-Fortuny, J. | |
dc.contributor.imecauthor | Saraza-Canflanca, P. | |
dc.contributor.imecauthor | Vandemaele, M. | |
dc.contributor.imecauthor | Bury, E. | |
dc.contributor.imecauthor | Degraeve, R. | |
dc.contributor.imecauthor | Kaczer, B. | |
dc.identifier.doi | 10.1109/LAEDC54796.2022.9908187 | |
dc.identifier.eisbn | 978-1-6654-9767-1 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE Latin American Electron Devices Conference (LAEDC) | |
dc.source.conferencedate | JUL 04-06, 2022 | |
dc.source.conferencelocation | Puebla | |
imec.availability | Under review |
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