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Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors
dc.contributor.author | Grill, A. | |
dc.contributor.author | John, V. | |
dc.contributor.author | Michl, J. | |
dc.contributor.author | Beckers, A. | |
dc.contributor.author | Bury, E. | |
dc.contributor.author | Tyaginov, S. | |
dc.contributor.author | Parvais, B. | |
dc.contributor.author | Chasin, A. Vaisman | |
dc.contributor.author | Grasser, T. | |
dc.contributor.author | Waltl, M. | |
dc.contributor.author | Kaczer, B. | |
dc.contributor.author | Govoreanu, B. | |
dc.date.accessioned | 2023-02-27T03:28:49Z | |
dc.date.available | 2023-02-27T03:28:49Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000922926400159 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41190 | |
dc.source | WOS | |
dc.title | Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Grill, A. | |
dc.contributor.imecauthor | John, V. | |
dc.contributor.imecauthor | Beckers, A. | |
dc.contributor.imecauthor | Bury, E. | |
dc.contributor.imecauthor | Tyaginov, S. | |
dc.contributor.imecauthor | Parvais, B. | |
dc.contributor.imecauthor | Chasin, A. Vaisman | |
dc.contributor.imecauthor | Kaczer, B. | |
dc.contributor.imecauthor | Govoreanu, B. | |
dc.identifier.doi | 10.1109/IRPS48227.2022.9764594 | |
dc.identifier.eisbn | 978-1-6654-7950-9 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 27-31, 2022 | |
dc.source.conferencelocation | Dallas | |
imec.availability | Under review |
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