Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs

Abstract

In this work, a detailed analysis of degradation and failure of semi-vertical GaN-on-Si trench MOSFETs is reported. OFF-state, semi-ON state and ON-state conditions were analyzed, to evaluate how the gate and drain bias can impact on the failure voltage. We demonstrate that: a) devices with a bilayer gate insulator (2.5 nm Al2O3 interface dielectric to GaN, + 35 nm SiO2 main dielectric) have a superior performance, compared to single-insulator (35 nm Al2O3) samples; b) in a drain step-stress, the gate voltage (resulting in different operating regimes, OFF, semi-ON or ON-state) can significantly impact on the failure voltage of the devices; c) stress at high V-GS and/or V-DS may induce a significant shift in threshold voltage, which is stronger when the devices are stressed in the ON-state. The results - complemented by 2D simulations - provide a description of the factors limiting the breakdown robustness of GaN vertical transistors.