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A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies
dc.contributor.author | Saraza-Canflanca, P. | |
dc.contributor.author | Carrasco-Lopez, H. | |
dc.contributor.author | Santana-Andreo, A. | |
dc.contributor.author | Diaz-Fortuny, J. | |
dc.contributor.author | Castro-Lopez, R. | |
dc.contributor.author | Roca, E. | |
dc.contributor.author | Fernandez, F. V. | |
dc.date.accessioned | 2023-02-27T03:29:05Z | |
dc.date.available | 2023-02-27T03:29:05Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000922926400153 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41197 | |
dc.source | WOS | |
dc.title | A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Diaz-Fortuny, J. | |
dc.identifier.doi | 10.1109/IRPS48227.2022.9764587 | |
dc.identifier.eisbn | 978-1-6654-7950-9 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 27-31, 2022 | |
dc.source.conferencelocation | Dallas | |
imec.availability | Under review |
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