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A Novel Ni-Al Alloy Metal Induced Lateral Crystallization Process for Improved Channel Conduction in 3-D NAND Flash
dc.contributor.author | Ramesh, S. | |
dc.contributor.author | Banerjee, K. | |
dc.contributor.author | Opsomer, K. | |
dc.contributor.author | Rachita, I | |
dc.contributor.author | Bastos, J. P. | |
dc.contributor.author | Soulie, J-Ph | |
dc.contributor.author | Sebaai, F. | |
dc.contributor.author | Favia, P. | |
dc.contributor.author | Korytov, M. | |
dc.contributor.author | Richard, O. | |
dc.contributor.author | Breuil, L. | |
dc.contributor.author | Arreghini, A. | |
dc.contributor.author | Van den Bosch, G. | |
dc.contributor.author | Rosmeulen, M. | |
dc.date.accessioned | 2023-03-02T03:30:59Z | |
dc.date.available | 2023-03-02T03:30:59Z | |
dc.date.issued | 2022-DEC | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.other | WOS:000924865400019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41213 | |
dc.source | WOS | |
dc.title | A Novel Ni-Al Alloy Metal Induced Lateral Crystallization Process for Improved Channel Conduction in 3-D NAND Flash | |
dc.type | Journal article | |
dc.contributor.imecauthor | Ramesh, S. | |
dc.contributor.imecauthor | Banerjee, K. | |
dc.contributor.imecauthor | Opsomer, K. | |
dc.contributor.imecauthor | Rachita, I | |
dc.contributor.imecauthor | Bastos, J. P. | |
dc.contributor.imecauthor | Soulie, J-Ph | |
dc.contributor.imecauthor | Sebaai, F. | |
dc.contributor.imecauthor | Favia, P. | |
dc.contributor.imecauthor | Korytov, M. | |
dc.contributor.imecauthor | Richard, O. | |
dc.contributor.imecauthor | Breuil, L. | |
dc.contributor.imecauthor | Arreghini, A. | |
dc.contributor.imecauthor | Van den Bosch, G. | |
dc.contributor.imecauthor | Rosmeulen, M. | |
dc.identifier.doi | 10.1109/LED.2022.3212105 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2085 | |
dc.source.endpage | 2088 | |
dc.source.journal | IEEE ELECTRON DEVICE LETTERS | |
dc.source.issue | 12 | |
dc.source.volume | 43 | |
imec.availability | Under review |
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