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Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies
dc.contributor.author | Bosman, Dries | |
dc.contributor.author | Huynen, Martijn | |
dc.contributor.author | De Zutter, Daniel | |
dc.contributor.author | Sun, Xiao | |
dc.contributor.author | Pantano, Nicolas | |
dc.contributor.author | Van Der Plas, Geert | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | Ginste, Dries Vande | |
dc.date.accessioned | 2023-03-18T03:37:51Z | |
dc.date.available | 2023-03-18T03:37:51Z | |
dc.date.issued | 2023-FEB 20 | |
dc.identifier.issn | 0018-9480 | |
dc.identifier.other | WOS:000940168700001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41303 | |
dc.source | WOS | |
dc.title | Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies | |
dc.type | Journal article | |
dc.type | Journal article (pre-print) | |
dc.contributor.imecauthor | Sun, Xiao | |
dc.contributor.imecauthor | Pantano, Nicolas | |
dc.contributor.imecauthor | Van Der Plas, Geert | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.identifier.doi | 10.1109/TMTT.2023.3244205 | |
dc.source.numberofpages | 13 | |
dc.source.peerreview | yes | |
dc.source.journal | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | |
imec.availability | Under review |
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