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Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies
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Authors
Bosman, Dries
;
Huynen, Martijn
;
De Zutter, Daniel
;
Sun, Xiao
;
Pantano, Nicolas
;
Van Der Plas, Geert
;
Beyne, Eric
;
Ginste, Dries Vande
DOI
10.1109/TMTT.2023.3244205
ISSN
0018-9480
Issue
7
Journal
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Volume
71
Title
Analysis and Application of a Surface Admittance Operator for Combined Magnetic and Dielectric Contrast in Emerging Interconnect Topologies
Publication type
Journal article
Embargo date
9999-12-31
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2
20.500.12860/41303.2
*
2023-07-24T09:50:50Z
validation by library/open access desk
1
20.500.12860/41303
2023-03-18T03:37:51Z
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