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Stress-induced effects by the anodic oxide in ridge waveguide laser diodes

dc.contributor.authorBuda, M.
dc.contributor.authorIordache, G.
dc.contributor.authorAcket, G. A.
dc.contributor.authorvan de Roer, T. G.
dc.contributor.authorKaufmann, L. M. F.
dc.contributor.authorvan Roy, B. H.
dc.contributor.authorSmalbrugge, E.
dc.contributor.authorMoerman, Ingrid
dc.contributor.authorSys, Carl
dc.date.accessioned2021-10-14T12:42:37Z
dc.date.available2021-10-14T12:42:37Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4162
dc.sourceIIOimport
dc.titleStress-induced effects by the anodic oxide in ridge waveguide laser diodes
dc.typeJournal article
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1174
dc.source.endpage1183
dc.source.journalIEEE J. Quantum Electronics
dc.source.issue10
dc.source.volume36
imec.availabilityPublished - open access


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