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dc.contributor.authorCao, Jingchen
dc.contributor.authorWynocker, Isabella
dc.contributor.authorZhang, En Xia
dc.contributor.authorReed, Robert A.
dc.contributor.authorAlles, Michael L.
dc.contributor.authorSchrimpf, Ronald D.
dc.contributor.authorFleetwood, Daniel M.
dc.contributor.authorArreghini, Antonio
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorBastos, Joao
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorLinten, Dimitri
dc.date.accessioned2023-08-01T15:01:09Z
dc.date.available2023-05-27T20:00:59Z
dc.date.available2023-06-27T08:10:58Z
dc.date.available2023-08-01T15:01:09Z
dc.date.issued2023-04-18
dc.identifier.issn0018-9499
dc.identifier.otherWOS:000975399300046
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41652.3
dc.sourceWOS
dc.titleEffects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide
dc.typeJournal article
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorBastos, Joao
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecBastos, Joao::0000-0002-8877-9850
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.date.embargo9999-12-31
dc.identifier.doi10.1109/TNS.2022.3227941
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.beginpage634
dc.source.endpage640
dc.source.journalIEEE TRANSACTIONS ON NUCLEAR SCIENCE
dc.source.issue4
dc.source.volume70
imec.availabilityPublished - open access
dc.description.wosFundingTextThis work was supported in part by the Defense Threat Reduction Agency through its Basic Research Program and in part by the Air Force Office of Scientific Research under Grant FA9550-17-1-0046 and Grant FA9550-22-1-0012. The work of Isabella Wynocker was supported in part by the SyBBURE Searle Undergraduate Research Program and in part by the SCALE Workforce Development Program.


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