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Fundamentals of low-resistive 2D-semiconductor metal contacts: an ab-initio NEGF study
dc.contributor.author | Duflou, Rutger | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Afzalian, Aryan | |
dc.date.accessioned | 2023-06-10T20:06:20Z | |
dc.date.available | 2023-06-10T20:06:20Z | |
dc.date.issued | 2023-MAY 31 | |
dc.identifier.other | WOS:000998448000001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41704 | |
dc.source | WOS | |
dc.title | Fundamentals of low-resistive 2D-semiconductor metal contacts: an ab-initio NEGF study | |
dc.type | Journal article | |
dc.contributor.imecauthor | Duflou, Rutger | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Afzalian, Aryan | |
dc.contributor.orcidimec | Duflou, Rutger::0000-0002-0357-1293 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.contributor.orcidimec | Afzalian, Aryan::0000-0002-5260-0281 | |
dc.identifier.doi | 10.1038/s41699-023-00402-3 | |
dc.source.numberofpages | 13 | |
dc.source.peerreview | yes | |
dc.source.journal | NPJ 2D MATERIALS AND APPLICATIONS | |
dc.source.issue | 1 | |
dc.source.volume | 7 | |
imec.availability | Under review |
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