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dc.contributor.authorClima, Sergiu
dc.contributor.authorMatsubayashi, Daisuke
dc.contributor.authorRavsher, Taras
dc.contributor.authorGarbin, Daniele
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorPourtois, Geoffrey
dc.date.accessioned2023-06-15T20:13:34Z
dc.date.available2023-06-15T20:13:34Z
dc.date.issued2023-JUN 3
dc.identifier.otherWOS:000999860700001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41742
dc.sourceWOS
dc.titleIn silico screening for As/Se-free ovonic threshold switching materials
dc.typeJournal article
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorRavsher, Taras
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecRavsher, Taras::0000-0001-7862-5973
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.identifier.doi10.1038/s41524-023-01043-2
dc.source.numberofpages8
dc.source.peerreviewyes
dc.source.journalNPJ COMPUTATIONAL MATERIALS
dc.source.issue1
dc.source.volume9
imec.availabilityUnder review


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