dc.contributor.author | Lee, Kookjin | |
dc.contributor.author | Ji, Hyunjin | |
dc.contributor.author | Kim, Yanghee | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Lee, Hyebin | |
dc.contributor.author | Ahn, Jae-Pyoung | |
dc.contributor.author | Choi, Junhee | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Panarella, Luca | |
dc.contributor.author | Smets, Quentin | |
dc.contributor.author | Verreck, Devin | |
dc.contributor.author | Van Beek, Simon | |
dc.contributor.author | Vaisman Chasin, Adrian | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Na, Junhong | |
dc.contributor.author | Lee, Jae Woo | |
dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | Kim, Gyu-Tae | |
dc.date.accessioned | 2023-08-21T09:29:59Z | |
dc.date.available | 2023-06-20T10:35:58Z | |
dc.date.available | 2023-08-21T09:29:59Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 2196-7350 | |
dc.identifier.other | WOS:000751745300001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41925.2 | |
dc.source | WOS | |
dc.title | Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications | |
dc.type | Journal article | |
dc.contributor.imecauthor | Lee, Kookjin | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Panarella, Luca | |
dc.contributor.imecauthor | Smets, Quentin | |
dc.contributor.imecauthor | Verreck, Devin | |
dc.contributor.imecauthor | Van Beek, Simon | |
dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.orcidext | Ahn, Jae-Pyoung::0000-0003-2657-7425 | |
dc.contributor.orcidext | Lee, Jae Woo::0000-0002-4376-476X | |
dc.contributor.orcidimec | Lee, Kookjin::0000-0002-9896-1090 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Verreck, Devin::0000-0002-3833-5880 | |
dc.contributor.orcidimec | Chasin, Adrian::0000-0002-9940-0260 | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.contributor.orcidimec | Smets, Quentin::0000-0002-2356-5915 | |
dc.contributor.orcidimec | Van Beek, Simon::0000-0002-2499-4172 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
dc.identifier.doi | 10.1002/admi.202102488 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 2102488 | |
dc.source.endpage | na | |
dc.source.journal | ADVANCED MATERIALS INTERFACES | |
dc.source.issue | 9 | |
dc.source.volume | 9 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | This research was supported by Nano-Material Technology Development Program through the National Research Foundation of Korea (NRF) funded by Ministry of Science and ICT (2017M3A7B4049119, Gyu-Tae Kim). H.J. also wishes to acknowledge the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2019R1A2C1010742). Further, J.W.L. also wishes to acknowledge the National Research Foundation of Korea (NRF) grant funded by the KOREA government (MSIT) (2019R1F1A1060687). | |