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Impact of advanced processing modules on the low-frequency noise performance of deep-submicron CMOS technologies

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-14T12:44:08Z
dc.date.available2021-10-14T12:44:08Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4193
dc.sourceIIOimport
dc.titleImpact of advanced processing modules on the low-frequency noise performance of deep-submicron CMOS technologies
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1815
dc.source.endpage1821
dc.source.journalMicroelectronics Reliability
dc.source.issue11
dc.source.volume40
imec.availabilityPublished - open access


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