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dc.contributor.authorLagos, Jorge
dc.contributor.authorMarkulic, Nereo
dc.contributor.authorHershberg, Benjamin
dc.contributor.authorDermit, Davide
dc.contributor.authorShrivas, Mithlesh
dc.contributor.authorMartens, Ewout
dc.contributor.authorCraninckx, Jan
dc.date.accessioned2023-06-20T10:36:22Z
dc.date.available2023-06-20T10:36:22Z
dc.date.issued2022-APR
dc.identifier.issn0018-9200
dc.identifier.otherWOS:000745438000001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41941
dc.sourceWOS
dc.titleA 10.1-ENOB, 6.2-fJ/conv.-step, 500-MS/s, Ringamp-Based Pipelined-SAR ADC With Background Calibration and Dynamic Reference Regulation in 16-nm CMOS
dc.typeJournal article
dc.contributor.imecauthorLagos, Jorge
dc.contributor.imecauthorMarkulic, Nereo
dc.contributor.imecauthorHershberg, Benjamin
dc.contributor.imecauthorDermit, Davide
dc.contributor.imecauthorShrivas, Mithlesh
dc.contributor.imecauthorMartens, Ewout
dc.contributor.imecauthorCraninckx, Jan
dc.contributor.orcidimecLagos, Jorge::0000-0001-5682-8737
dc.contributor.orcidimecHershberg, Benjamin::0000-0003-3688-2589
dc.contributor.orcidimecShrivas, Mithlesh::0000-0001-6063-2059
dc.contributor.orcidimecMarkulic, Nereo::0000-0001-6691-4647
dc.contributor.orcidimecMartens, Ewout::0000-0001-5485-1837
dc.contributor.orcidimecCraninckx, Jan::0000-0002-3980-0203
dc.identifier.doi10.1109/JSSC.2021.3133829
dc.source.numberofpages13
dc.source.peerreviewyes
dc.source.beginpage1112
dc.source.endpage1124
dc.source.journalIEEE JOURNAL OF SOLID-STATE CIRCUITS
dc.source.issue4
dc.source.volume57
imec.availabilityUnder review


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