Reliability aspects of cryogenic silicon technologies
| dc.contributor.editor | Claeys, Cor | |
| dc.contributor.editor | Simoen, Eddy | |
| dc.date.accessioned | 2021-10-14T12:44:17Z | |
| dc.date.available | 2021-10-14T12:44:17Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4196 | |
| dc.source | IIOimport | |
| dc.title | Reliability aspects of cryogenic silicon technologies | |
| dc.type | Book chapter | |
| dc.date.embargo | 9999-12-31 | |
| dc.source.peerreview | no | |
| dc.source.beginpage | 259 | |
| dc.source.book | Low Temperature Electronics: Physics, Devices, Circuits, and Applications | |
| dc.source.endpage | 384 | |
| imec.availability | Published - open access | |
| imec.internalnotes | Chapter 3 |