dc.contributor.author | Kaczmarek, Jakub | |
dc.contributor.author | Garcia Bardon, Marie | |
dc.contributor.author | Xiang, Yang | |
dc.contributor.author | Ronchi, Nicolo | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Celano, Umberto | |
dc.contributor.author | Banerjee, Kaustuv | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2023-11-22T10:17:12Z | |
dc.date.available | 2023-06-26T20:41:51Z | |
dc.date.available | 2023-11-22T10:17:12Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.other | WOS:001006193000001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42098.2 | |
dc.source | WOS | |
dc.title | Variability in Planar FeFETs-Channel Percolation Impact | |
dc.type | Journal article | |
dc.contributor.imecauthor | Kaczmarek, Jakub | |
dc.contributor.imecauthor | Garcia Bardon, Marie | |
dc.contributor.imecauthor | Xiang, Yang | |
dc.contributor.imecauthor | Ronchi, Nicolo | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Celano, Umberto | |
dc.contributor.imecauthor | Banerjee, Kaustuv | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Garcia Bardon, Marie::0000-0001-5772-5406 | |
dc.contributor.orcidimec | Xiang, Yang::0000-0003-0091-6935 | |
dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
dc.contributor.orcidimec | Banerjee, Kaustuv::0000-0001-8003-6211 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.identifier.doi | 10.1109/TED.2023.3277421 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 3928 | |
dc.source.endpage | 3934 | |
dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
dc.source.issue | 7 | |
dc.source.volume | 70 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | This work was supported by the imec's Industrial Affiliation Program (IIAP). | |