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Advanced characterization methods for HfO2/ZrO2-based ferroelectrics

dc.contributor.authorLomenzo, Patrick D. D.
dc.contributor.authorCelano, Umberto
dc.contributor.authorKaempfe, Thomas
dc.contributor.authorMcMitchell, Sean R. C.
dc.date.accessioned2023-06-30T21:08:50Z
dc.date.available2023-06-30T21:08:50Z
dc.date.issued2023-JAN 24
dc.identifier.otherWOS:000993463300001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42109
dc.sourceWOS
dc.titleAdvanced characterization methods for HfO2/ZrO2-based ferroelectrics
dc.typeEditorial material
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorMcMitchell, Sean R. C.
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.identifier.doi10.3389/fnano.2023.1114267
dc.source.numberofpages2
dc.source.peerreviewyes
dc.source.journalFRONTIERS IN NANOTECHNOLOGY
dc.source.volume5
imec.availabilityUnder review


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220.500.12860/42109.22023-08-09T09:30:35Zvalidation by library/open access desk
120.500.12860/42109*2023-06-30T21:08:50Z

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