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Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
dc.contributor.author | Zenari, Michele | |
dc.contributor.author | Buffolo, Matteo | |
dc.contributor.author | Fornasier, Mirko | |
dc.contributor.author | De Santi, Carlo | |
dc.contributor.author | Goyvaerts, Jeroen | |
dc.contributor.author | Grabowski, Alexander | |
dc.contributor.author | Gustavsson, Johan | |
dc.contributor.author | Kumari, Sulakshna | |
dc.contributor.author | Stassren, Andim | |
dc.contributor.author | Baets, Roel | |
dc.contributor.author | Larsson, Anders | |
dc.contributor.author | Roelkens, Gunther | |
dc.contributor.author | Meneghesso, Gaudenzio | |
dc.contributor.author | Zanoni, Enrico | |
dc.contributor.author | Meneghini, Matteo | |
dc.date.accessioned | 2023-07-08T21:01:10Z | |
dc.date.available | 2023-07-08T21:01:10Z | |
dc.date.issued | 2023-AUG | |
dc.identifier.issn | 0018-9197 | |
dc.identifier.other | WOS:001016754600001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42135 | |
dc.source | WOS | |
dc.title | Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits | |
dc.type | Journal article | |
dc.contributor.imecauthor | Goyvaerts, Jeroen | |
dc.contributor.imecauthor | Kumari, Sulakshna | |
dc.contributor.imecauthor | Stassren, Andim | |
dc.contributor.imecauthor | Baets, Roel | |
dc.contributor.imecauthor | Roelkens, Gunther | |
dc.contributor.orcidimec | Baets, Roel::0000-0003-1266-1319 | |
dc.contributor.orcidimec | Roelkens, Gunther::0000-0002-4667-5092 | |
dc.identifier.doi | 10.1109/JQE.2023.3283514 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.source.journal | IEEE JOURNAL OF QUANTUM ELECTRONICS | |
dc.source.issue | 4 | |
dc.source.volume | 59 | |
imec.availability | Under review |
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