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Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
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Authors
Zenari, Michele
;
Buffolo, Matteo
;
Fornasier, Mirko
;
De Santi, Carlo
;
Goyvaerts, Jeroen
;
Grabowski, Alexander
;
Gustavsson, Johan
;
Kumari, Sulakshna
;
Stassen, Andim
;
Baets, Roel
;
Larsson, Anders
;
Roelkens, Gunther
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
;
Meneghini, Matteo
DOI
10.1109/JQE.2023.3283514
ISSN
0018-9197
Issue
4
Journal
IEEE JOURNAL OF QUANTUM ELECTRONICS
Volume
59
Title
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
Publication type
Journal article
Embargo date
9999-12-31
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Summary
2
20.500.12860/42135.2
*
2023-08-09T09:55:38Z
validation by library/open access desk
1
20.500.12860/42135
2023-07-08T21:01:10Z
*Selected version
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