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Peripheral leakage in gated silicon p-n junctions

dc.contributor.authorCzerwinski, A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorPoyai, Amporn
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T12:46:16Z
dc.date.available2021-10-14T12:46:16Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4227
dc.sourceIIOimport
dc.titlePeripheral leakage in gated silicon p-n junctions
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage6506
dc.source.endpage6514
dc.source.journalJournal of Applied Physics
dc.source.issue11
dc.source.volume88
imec.availabilityPublished - open access


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