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Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
dc.contributor.author | Chang, Ting-Yu | |
dc.contributor.author | Wang, Kuan-Chi | |
dc.contributor.author | Liu, Hsien-Yang | |
dc.contributor.author | Hseun, Jing-Hua | |
dc.contributor.author | Peng, Wei-Cheng | |
dc.contributor.author | Ronchi, Nicolo | |
dc.contributor.author | Celano, Umberto | |
dc.contributor.author | Banerjee, Kaustuv | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Wu, Tian-Li | |
dc.date.accessioned | 2023-08-11T16:46:11Z | |
dc.date.available | 2023-08-11T16:46:11Z | |
dc.date.issued | 2023-JUL | |
dc.identifier.other | WOS:001038850900001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42325 | |
dc.source | WOS | |
dc.title | Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory | |
dc.type | Journal article | |
dc.contributor.imecauthor | Ronchi, Nicolo | |
dc.contributor.imecauthor | Celano, Umberto | |
dc.contributor.imecauthor | Banerjee, Kaustuv | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
dc.contributor.orcidimec | Banerjee, Kaustuv::0000-0001-8003-6211 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.identifier.doi | 10.3390/nano13142104 | |
dc.source.numberofpages | 9 | |
dc.source.peerreview | yes | |
dc.source.journal | NANOMATERIALS | |
dc.identifier.pmid | MEDLINE:37513115 | |
dc.source.issue | 14 | |
dc.source.volume | 13 | |
imec.availability | Under review |
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