Publication:
Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
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Acq. date: 2026-01-12
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203 since deposited on 2023-08-11
22last month
4last week
Acq. date: 2026-01-12
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975 since deposited on 2023-08-11
Acq. date: 2026-01-12
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