Publication:
Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
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264 since deposited on 2023-08-11
27last month
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Acq. date: 2026-03-16
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978 since deposited on 2023-08-11
2last month
Acq. date: 2026-03-17
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