Publication:
Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
Loading...
Journal
Abstract
Description
Statistics
Downloads
278 since deposited on 2023-08-11
23last month
5last week
Acq. date: 2026-04-06
Views
979 since deposited on 2023-08-11
1last month
1last week
Acq. date: 2026-04-06
Citations
Statistics
Downloads
278 since deposited on 2023-08-11
23last month
5last week
Acq. date: 2026-04-06
Views
979 since deposited on 2023-08-11
1last month
1last week
Acq. date: 2026-04-06
Citations