Publication:
Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
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178 since deposited on 2023-08-11
29last month
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975 since deposited on 2023-08-11
1last month
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Acq. date: 2025-12-10
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