Publication:

Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory

Date

2023
Journal article
https://doi.org/10.3390/nano13142104
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Author(s)

Chang, Ting-Yu
;
Wang, Kuan-Chi
;
Liu, Hsien-Yang
;
Hseun, Jing-Hua
;
Peng, Wei-Cheng
;
Ronchi, Nicolo  
;
Celano, Umberto  
;
Banerjee, Kaustuv  
;
Van Houdt, Jan  
;
Wu, Tian-Li

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NANOMATERIALS

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244 since deposited on 2023-08-11
32last month
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Acq. date: 2026-02-24

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978 since deposited on 2023-08-11
3last month
2last week
Acq. date: 2026-02-24

Citations