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dc.contributor.authorZborowski, Charlotte
dc.contributor.authorVanleenhove, Anja
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorVaesen, Inge
dc.contributor.authorArtyushkova, K.
dc.contributor.authorConard, Thierry
dc.date.accessioned2023-10-11T09:51:59Z
dc.date.available2023-08-27T17:28:48Z
dc.date.available2023-10-11T09:51:59Z
dc.date.issued2023
dc.identifier.issn1055-5269
dc.identifier.otherWOS:001048424000005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42406.2
dc.sourceWOS
dc.titleXPS Al K-a and high energy x-ray photoelectron spectroscopy (HAXPES) Cr K-a measurement of bulk boron
dc.typeJournal article
dc.contributor.imecauthorZborowski, Charlotte
dc.contributor.imecauthorVanleenhove, Anja
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorVaesen, Inge
dc.contributor.imecauthorConard, Thierry
dc.contributor.orcidimecVanleenhove, Anja::0000-0001-5481-9642
dc.contributor.orcidimecVaesen, Inge::0000-0003-3533-4679
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.identifier.doi10.1116/6.0002765
dc.source.numberofpages11
dc.source.peerreviewyes
dc.source.beginpageArt. 024008
dc.source.endpagena
dc.source.journalSURFACE SCIENCE SPECTRA
dc.source.issue2
dc.source.volume30
imec.availabilityPublished - imec


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