dc.contributor.author | Tyaginov, Stanislav | |
dc.contributor.author | Bury, Erik | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Yu, Z. | |
dc.contributor.author | Makarov, Alexander | |
dc.contributor.author | De Keersgieter, An | |
dc.contributor.author | Vexler, M. I. | |
dc.contributor.author | Vandemaele, Michiel | |
dc.contributor.author | Wang, R. | |
dc.contributor.author | Spessot, Alessio | |
dc.contributor.author | Vaisman Chasin, Adrian | |
dc.contributor.author | Kaczer, Ben | |
dc.date.accessioned | 2024-05-23T14:46:49Z | |
dc.date.available | 2023-09-03T17:38:59Z | |
dc.date.available | 2024-05-23T14:46:49Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | N/A | |
dc.identifier.other | WOS:001004185500179 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42459.2 | |
dc.source | WOS | |
dc.title | On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling Perspective | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Yu, Z. | |
dc.contributor.imecauthor | Tyaginov, Stanislav | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Makarov, Alexander | |
dc.contributor.imecauthor | De Keersgieter, An | |
dc.contributor.imecauthor | Vandemaele, Michiel | |
dc.contributor.imecauthor | Spessot, Alessio | |
dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Tyaginov, Stanislav::0000-0002-5348-2096 | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Makarov, Alexander::0000-0002-9927-6511 | |
dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
dc.contributor.orcidimec | Spessot, Alessio::0000-0003-2381-0121 | |
dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.identifier.doi | 10.1109/EDTM55494.2023.10103111 | |
dc.identifier.eisbn | 979-8-3503-3252-0 | |
dc.source.numberofpages | 3 | |
dc.source.peerreview | yes | |
dc.source.conference | 7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM) | |
dc.source.conferencedate | MAR 07-10, 2023 | |
dc.source.conferencelocation | Seoul | |
dc.source.journal | N/A | |
imec.availability | Published - imec | |
dc.description.wosFundingText | this work was partially supported by the Ministry of Science and Higher Education of the Russian Federation under Grant number 075-15-2020-790. | |