dc.contributor.author | Asanovski, Ruben | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Palestri, Pierpaolo | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Selmi, Luca | |
dc.date.accessioned | 2024-03-19T08:59:35Z | |
dc.date.available | 2023-10-05T17:19:25Z | |
dc.date.available | 2024-03-19T08:59:35Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.other | WOS:001071171700001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42651.2 | |
dc.source | WOS | |
dc.title | Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques | |
dc.type | Journal article | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.date.embargo | 2023-08-02 | |
dc.identifier.doi | 10.1016/j.sse.2023.108722 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 108722 | |
dc.source.endpage | N/A | |
dc.source.journal | SOLID-STATE ELECTRONICS | |
dc.source.issue | September | |
dc.source.volume | 207 | |
imec.availability | Published - open access | |