Publication:
Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
Loading...
Journal
Abstract
Description
Metrics
Downloads
217 since deposited on 2023-10-05
22last month
Acq. date: 2026-01-07
Views
859 since deposited on 2023-10-05
Acq. date: 2026-01-06
Citations
Metrics
Downloads
217 since deposited on 2023-10-05
22last month
Acq. date: 2026-01-07
Views
859 since deposited on 2023-10-05
Acq. date: 2026-01-06
Citations