Publication:
Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
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Acq. date: 2026-09-14
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862 since deposited on 2023-10-05
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391 since deposited on 2023-10-05
53last month
7last week
Acq. date: 2026-09-14
Views
862 since deposited on 2023-10-05
Acq. date: 2026-09-14
Citations