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Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
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Acq. date: 2026-02-25
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236 since deposited on 2023-10-05
7last month
2last week
Acq. date: 2026-02-25
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859 since deposited on 2023-10-05
Acq. date: 2026-02-25
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